Biblio

Export 1 results:
Filters: Author is Alon Shakevsky  [Clear All Filters]
2022
Shakevsky A, Ronen E, Wool A.  2022.  Trust Dies in Darkness: Shedding Light on Samsung's TrustZone Keymaster Design. 31st USENIX Security Symposium (USENIX Security 22). :251--268.