Exposure Maps: Removing Reliance on Attribution During Scan Detection

TitleExposure Maps: Removing Reliance on Attribution During Scan Detection
Publication TypeConference Paper
Year of Publication2006
AuthorsWhyte D, van Oorschot P.C., Kranakis E
Conference NameFirst USENIX Workshop on Hot Topics in Security (HotSec 06)
Date Published07/2006
PublisherUSENIX Association
Conference LocationVancouver, B.C. Canada
URLhttps://www.usenix.org/conference/hotsec-06/exposure-maps-removing-reliance-attribution-during-scan-detection