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Pre-Election Testing and Post-Election Audit of Optical Scan Voting Terminal Memory Cards

Seda Davtyan, University of Connecticut

Sotiris Kentros, University of Connecticut

Aggelos Kiayias, University of Connecticut

Laurent Michel, University of Connecticut

Nicolas Nicolaou, University of Connecticut

Alexander Russell, University of Connecticut

Andrew See, University of Connecticut

Narasimha Shashidhar, University of Connecticut

Alexander A. Shvartsman, University of Connecticut

BibTeX
@inproceedings {268142,
author = {Seda Davtyan and Sotiris Kentros and Aggelos Kiayias and Laurent Michel and Nicolas Nicolaou and Alexander Russell and Andrew See and Narasimha Shashidhar and Alexander A. Shvartsman},
title = {{Pre-Election} Testing and {Post-Election} Audit of Optical Scan Voting Terminal Memory Cards},
booktitle = {2008 USENIX/ACCURATE Electronic Voting Technology Workshop (EVT 08)},
year = {2008},
address = {San Jose, CA},
url = {https://www.usenix.org/conference/evt-08/pre-election-testing-and-post-election-audit-optical-scan-voting-terminal-memory},
publisher = {USENIX Association},
month = jul
}
Download

Links

Paper: 
http://usenix.org/event/evt08/tech/full_papers/davtyan/davtyan.pdf
Paper (HTML): 
http://usenix.org/event/evt08/tech/full_papers/davtyan/davtyan_html/
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