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Home » On the Non-Suitability of Non-Volatility
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On the Non-Suitability of Non-Volatility

Authors: 

John Bent, EMC Corporation; Brad Settlemyer and Nathan DeBardeleben, Los Alamos National Laboratory; Sorin Faibish, Uday Gupta, Dennis Ting, and Percy Tzelnic, EMC Corporation

Abstract: 

For many emerging and existing architectures, NAND flash is the storage media used to fill the cost-performance gap between DRAM and spinning disk. However, while NAND flash is the best of the available options, for many workloads its specific design choices and trade-offs are not wholly suitable. One such workload is long-running scientific applications which use checkpoint-restart for failure recovery. For these workloads, HPC data centers are deploying NAND flash as a storage acceleration tier, commonly called burst buffers, to provide high levels of write bandwidth for checkpoint storage. In this paper, we compare the costs of adding reliability to such a layer versus the benefits of not doing so. We find that, even though NAND flash is non-volatile, HPC burst buffers should not be reliable when the performance overhead of adding reliability is greater than 2%.

John Bent, EMC Corporation

Brad Settlemyer, Los Alamos National Laboratory

Nathan DeBardeleben, Los Alamos National Laboratory

Sorin Faibish, EMC Corporation

Dennis Ting, EMC Corporation

Uday Gupta, EMC Corporation

Percy Tzelnic, EMC Corporation

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Bent
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BibTeX
@inproceedings {190577,
author = {John Bent and Brad Settlemyer and Nathan DeBardeleben and Sorin Faibish and Dennis Ting and Uday Gupta and Percy Tzelnic},
title = {On the Non-Suitability of Non-Volatility},
booktitle = {7th {USENIX} Workshop on Hot Topics in Storage and File Systems (HotStorage 15)},
year = {2015},
address = {Santa Clara, CA},
url = {https://www.usenix.org/conference/hotstorage15/workshop-program/presentation/bent},
publisher = {{USENIX} Association},
}
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