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Improved Device Driver Reliability Through Verification Reuse

Leonid Ryzhyk

NICTA

University of New South Wales

John Keys, Intel Corporation

Balachandra Mirla

Arun Raghunath, Intel Corporation

Mona Vij, Intel Corporation

Gernot Heiser

BibTeX
@inproceedings {267171,
author = {Leonid Ryzhyk and NICTA and University of New South Wales and John Keys and Balachandra Mirla and Arun Raghunath and Mona Vij and Gernot Heiser},
title = {Improved Device Driver Reliability Through Verification Reuse},
booktitle = {Sixth Workshop on Hot Topics in System Dependability (HotDep 10)},
year = {2010},
address = {Vancouver, BC},
url = {https://www.usenix.org/conference/hotdep10/improved-device-driver-reliability-through-verification-reuse},
publisher = {USENIX Association},
month = oct
}
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Links

Paper: 
http://www.usenix.org/events/hotdep10/tech/full_papers/Ryzhyk.pdf
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