Simple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed Data-Intensive Systems

TitleSimple Testing Can Prevent Most Critical Failures: An Analysis of Production Failures in Distributed {Data-Intensive} Systems
Publication TypeConference Paper
Year of Publication2014
AuthorsYuan D, Luo Y, Zhuang X, Rodrigues GRenna, Zhao X, Zhang Y, Jain PU, Stumm M
Conference Name11th USENIX Symposium on Operating Systems Design and Implementation (OSDI 14)
Date Published10/2014
PublisherUSENIX Association
Conference LocationBroomfield, CO
ISBN Number 978-1-931971-16-4
URLhttps://www.usenix.org/conference/osdi14/technical-sessions/presentation/yuan