Hybrid Data Reliability for Emerging Key-Value Storage Devices

TitleHybrid Data Reliability for Emerging Key-Value Storage Devices
Publication TypeConference Paper
Year of Publication2020
AuthorsPitchumani R, Kee Y-S
Conference Name18th USENIX Conference on File and Storage Technologies (FAST 20)
Date Published02/2020
PublisherUSENIX Association
Conference LocationSanta Clara, CA
ISBN Number978-1-939133-12-0
URLhttps://www.usenix.org/conference/fast20/presentation/pitchumani